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1·Some problems in logic cluster boundary scan test could not be neglected.

逻辑簇的边界扫描测试存在一些不可忽视的重要问题。

2·SRAM BIST is also combined with ARM core's boundary scan testing during system level DFT.

系统级可测性设计主要是将存储器BIST与ARM核的边界扫描测试相结合。

3·There are some common methods of design for testability, such as boundary scan test and so on.

目前常见的可测试性设计方法主要有改善设计法、结构设计法和边界扫描测试法等几种。

4·As a kind of new developing BIT technology, Boundary scan technology is widely used in industry.

边界扫描技术作为一种新兴的BIT技术，在工业界内得到了广泛的应用。

5·We have developed a new On-line Connecting Test System based on JTAG boundary scan for computer plug-unit or system.

在某计算机系统中设计了基于JTAG边界扫描计算机插件或系统在线导通测试系统，这是一个新颖通用的系统。

6·The CPU module 's fault is detected in no - disturb way for the first time with the advanced boundary scan technology.

首次采用先进的边界扫描技术实现了以无打扰的方式完成CPU模块的故障检测。

7·Establishing an unite interface of chip test and debug which embodies the boundary scan and complements the full scan.

建立一个统一的芯片测试和芯片诊断调试接口，形成以边界扫描链为主体，全扫描链为补充的芯片测试机制。

8·Grand scale IC chip that every important company produces at present is almost all having the boundary scan structure.

并且目前各大公司生产的超大规模集成电路芯片基本全部具有边界扫描结构。

9·The miniaturization of electronic products results in automatic testing, which is made possible by boundary scan technology.

电子产品微型化使自动测试成为必然，而边界扫描技术则使自动测试成为可能。

10·Therefore the method making use of boundary scan structure to carry out a debugging on system arises at the historic moment.

因此利用边界扫描结构来对系统进行调试的方法应运而生。