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1·Experimental results show that this approach is efficient and automated in test vector translation.

实验结果表明，该周期化方法是一种行之有效的测试向量转换方法。

2·A new BIST structure with the method of test vector generation based on a controlled LFSR is proposed.

本文提出了一种基于受控线性反馈移位寄存器（LFSR）进行内建自测试的结构及其测试矢量生成方法。

3·A new test vector generation method for Multi-capture structure is presented to generate more efficient vectors.

本文还提出了一种面向最小相关度多捕获结构的测试向量生成算法。

4·This paper studies a test vector generation algorithm for digital circuits which can locate the component faults.

结合一个实际电路，研究了一种可把数字电路故障定位到器件级的测试向量生成算法。

5·The algorithm maps test vector space to the chaotic space and USES chaotic search to find out the suitable testing pairs.

该算法将测试向量空间映射到混沌空间并采用混沌搜索来寻找一对符合要求的测试向量对。

6·Controllable LFSR can adjust test vector sequence generated by original LFSR through control codes which stored in the ate or ROM.

可控LFSR可以通过一些控制码对LFSR的原始产生顺序进行调整，这些控制码存储在ate中或ROM中。

7·This paper introduces the special software and flow converted from VCD test vector to STIL test vector, which is based of SAPPHIRE SOC test System.

本文基于SAPPHIRE集成电路测试系统，介绍了自行开发的从VCD测试向量到STIL测试向量的转换软件及流程。

8·Circuits described are modeled to behavior sets after abstraction, and can be replaced by their behavior sets during functional test vector generation procedures.

通过抽象，电路可以规范为行为集，并代替电路本身进行功能测试向量的生成。

9·The test vectors of some sub-scan chains generate by controllable LFSR when these chains only need to update test vector and do not need to shift out test responses.

当某个子扫描链的测试向量需要更新且又不需要移出其测试响应时，其测试向量由可控LFSR产生。

10·During the period of employing IEEE1445 to resolve the problem of fault diagnose, the test vector set's reduction is a hard problem to the entire developing process.

在利用IEEE1445标准来完成电路板的故障诊断时，矢量的约简是整个测试程序开发过程中的一个难点。