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1·After analyzed the effect of preload voltage and sweep voltage on the negative electrostatic spring stiffness, a method to dissociate mechanical stiffness from the system stiffness has been provided.

通过分析预载电压和扫频信号幅值对静电负刚度的影响，提出了从系统刚度中分离出挠性梁机械刚度的计算方法。

2·Measuring the reverse bias current of an APD requires an instrument that can measure current over a wide range as well as output a voltage sweep.

测量APD的反向偏置电流需要一种能够在很宽范围内测量电流并且能输出扫描电压的仪器。

3·The light intensity (l) current (I) voltage (v) sweep is a series of measurements performed on VCSELs to determine their operating characteristics.

光强度(L) -电流(I) -电压(V)扫描是确定VCSEL工作特性而进行的一系列测量。

4·A method for rapidly determining long generation lifetime under linear voltage sweep was presented.

本文提出了线性电压扫描下长产生寿命的快速测量方法。

5·An experimental method to determine minority carrier generation lifetime from the values of saturation capacitance under two different voltage sweep rates has been presented.

本文建议子一种由两个不同电压扫描率下的饱和电容值确定产生寿命的实验方法。

6·The experimental results show that for the same MOS capacitor sample the obtained values of generation lifetime from varying association of voltage sweep rates are close each other.

实验结果表明，对于同一个MOS电容器样品，从不同电压扫描率组合得到的产生寿命值基本一致。

7·On the basis of this, a method of using twice sweep under different voltage sweep rates for determining both bulk generation lifetime and surface generation velocity is proposed.

在此基础上，建议了一种通过两次不同电压扫描率的线性电压扫描来测定半导体的体产生寿命和表面产生速度的方法。

8·Simulate the avalanche circuit in series with PSPICE module, design the high voltage short plus generation circuit by avalanche transistor in series for the sweep deflection circuit of streak camera.

运用PSPICE模型对串联雪崩电路进行了仿真，设计出了用雪崩三极管串联的高压短脉冲产生电路，该电路可以用于条纹相机中的扫描电路。

9·Image processing method is used to carry out frequency sweep and voltage sweep measurement. The in-plane motion characteristic of MEMS is obtained and the testing results are analyzed and discussed.

利用图像处理方法对MEMS谐振器做扫频和扫压测量，获得了MEMS器件的平面微运动特性，并对测量结果进行了分析和讨论。