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1·The crystal structure was determined with four-circle diffractometer.

用四圆衍射仪测定了晶体结构。

2·The products after ignition were examined through X-ray diffractometer.

用X衍射仪测定了点火后的生成物。

3·The crystalline property of granular resistant starch(RS) was studied by X-ray diffractometer.

采用X-射线衍射仪对颗粒态抗性淀粉的结晶性质进行了研究。

4·It was characterized by optical microscope, SEM, IR, DSC and X-rays diffractometer respectively.

采用光学显微镜、SEM、IR、DSC和X射线衍射等多种手段对其进行表征。

5·The Principle of X-ray diffractometer method of macrostress measurement is described in this Paper.

本文叙述了使用X射线衍射仪法测量宏观应力的原理。

6·The copolymer was confirmed by means of Infrared spectroscopy, Microscope and X-ray diffractometer.

利用红外光谱、显微镜和X -射线衍射等手段对产物进行了结构和性能表征。

7·The microstructure of the coating is analysed with metallographic microscope and X ray diffractometer.

用金相显微镜和X射线衍射仪分析涂层的显微组织。

8·Result for X-ray diffractometer test indicates that no oxidization occurred during the spraying process.

射线衍射分析结果表明冷喷涂过程中，无氧化现象发生。

9·The products were well-characterized by X-ray diffractometer (XRD) and scanning electron microscope (SEM).

所得产物用X射线衍射仪(XRD)和扫描电子显微镜(SEM)进行了表征。

10·The implanted samples were analyzed using X ray diffractometer (XRD) and X ray photoelectron spectrometer (XPS).

注入后的样品用X射线衍射方法(XRD)以及光电子能谱方法(XPS)进行分析。

衍射仪

1·The hardness gradient, depth, microstructure and phases of nitrided layers were measured with Microhardness Apparatus, Microcopy and X-ray diffractometer.

利用显微硬度计、金相显微镜和X射线衍射仪测定了渗氮层的硬度梯度、层深、显微组织和相组成。

2·This paper introduces X-ray diffractometer application of petroleum geology and petroleum project in Jiangsu oilfield, and geological meaning of petroleum exploration and production.

介绍了X射线衍射仪在江苏油田石油地质、石油工程的应用以及对石油勘探和开发的地质意义。

3·The crystal structure of the partly deuterized triglycine sulfate was studied by four-circle neutron diffractometer.

用中子四圆衍射仪测量了部分氚化的硫酸三甘氨酸的晶体结构。

4·The crystal structures of bastnaesite-(Ce) and fluocerite-(Ce) was refined by high power four-circle X-ray diffractometer.

用强功率四圆单晶衍射仪精确地修正了氟碳铈矿和氟铈矿的晶体结构。

5·The structural properties of the films were analyzed by X ray photo electron spectroscopy (XPS), X ray diffractometer (XRD) and atomic force microscope (AFM).

使用X射线光电子能谱仪(XPS)、X射线衍射仪(XRD)、原子力显微镜(afm)对薄膜的结构进行了分析。