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1·In this case, defect density is a measure of review effectiveness.

在这种情况下，缺陷密度就是“评审有效性”的评价手段。

2·The results show that the defect density is decreased great after treatment.

结果表明：通过加温可以降低薄膜的表面粗糙度与缺陷密度大小。

3·Silicon carbide crystals having regions of higher and lower defect density are also provided.

碳化硅晶体较高和较低的缺陷密度地区也有提供。

4·As the number of lines of code under review grows beyond 200, defect density drops off considerably.

评审代码行的数量超过200时，缺陷密度就会急剧地下降。

5·The most common internal metrics for code review are inspection rate, defect rate, and defect density.

代码评审的最常见内部性制度是 检查率 ，缺陷率，以及 缺陷密度。

6·It was shown that the film surface defect density could decreased by applying deposition temperature.

结果表明：通过加温可以降低薄膜的表面粗糙度与缺陷密度大小。

7·To obtain high quality semi-insulating GaAs wafers, it is necessary to decrease microscopic defect density.

为了获得高质量半绝缘砷化镓单晶片，有必要降低微缺陷密度。

8·To find the optimal inspection rate, we compared defect density with how fast the reviewer went through the code.

为了找到优化的检查率，我们将缺陷密度与评审者检查代码的速度进行了比较。

9·The more discerning QA can be in establishing the size of a release, the more useful that defect density becomes.

更有见识的QA能够看出一个发布的规模，这将使缺陷密度变更更加有用。

10·The graph in Figure 1, which plots defect density against the number of lines of code under review, supports this rule.

图 1 中的图，描述了缺陷密度与评审代码行数量之间的关系，支持该规则。