全部

1·Gary Bist is a Staff Technical Writer at IBM's Toronto Lab.

Gary Bist是IBM多伦多实验室的专职技术作家。

2·Absrtact: Novel BIST scheme for SOC was presented in this paper.

摘要：文中提出了一种新颍的SOC芯片BIST方案。

3·In this thesis, we research on scan-based BIST techniques of digital systems.

本论文对数字系统基于扫描的BIST技术进行了深入研究。

4·SRAM BIST is also combined with ARM core's boundary scan testing during system level DFT.

系统级可测性设计主要是将存储器BIST与ARM核的边界扫描测试相结合。

5·The proposed BIST scheme relies on a pseudo-random testing phase and a deterministic phase.

这一自测试策略包含伪随机测试阶段和确定性测试阶段。

6·In this paper, the SOC design characteristics and mixed-mode testing of the BIST were discussed.

文中对SOC的设计特点及其BIST中的混合模式测试进行了探讨。

7·For the linear analog circuits, a BIST method based on the system's state variables is presented.

本文针对线性模拟电路，提出了一种基于系统状态变量的BIST方法。

8·The BIST structure circuit is simple and feasible, and the corresponding algorithm is easy to achieve.

电路结构简单可行，提供的相应算法也易于实现。

9·A new BIST structure with the method of test vector generation based on a controlled LFSR is proposed.

本文提出了一种基于受控线性反馈移位寄存器（LFSR）进行内建自测试的结构及其测试矢量生成方法。

10·BIST has been applied into transient current testing as an effective method to reduce testing spending.

内建自测试(BIST)是一种有效降低测试开销的技术，在瞬态电流测试中得到了应用。