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1·UPS ultraviolet photoelectron spectroscopy;

紫外光电子谱术；

2·The technique of coupling ultraviolet photoelectron spectroscopy (UPS) with time-of-flight mass spectrometry (TOFMS) is described.

本文报道了将紫外光电子能谱(ups)和飞行时间质谱(TOFMS)相结合的技术。

3·Then, the films were characterized with X ray photoelectron spectroscopy(XPS), X ray diffraction(XRD), ultraviolet visible light absorption spectroscopy, and atomic force microscopy(AFM).

用X光电子能谱、X射线衍射、紫外可见吸收光谱、原子力显微镜等手段对制备的薄膜进行了表征。